Thermally stimulated depolarization current measurements on degraded lead zirconate titanate films

Charge transport mechanisms governing DC resistance degradation in ferroelectric films are influenced by defects, particularly oxygen vacancies. This paper demonstrates that vacancies migrate lead zirconate titanate (PZT) under a bias field and contribute to degradation. Model PZT thin were developed which the concentration distribution of controlled via (a) changing dopant type from 1%–4% Mn (acceptor) Nb (donor) or (b) annealing undoped at varying partial pressures PbO. The presence associated (immobile) dissociated (mobile) was distinguished thermally stimulated depolarization current (TSDC) measurements. impact mobile on local defect chemistry charge explored electron energy loss spectroscopy (EELS). For Mn-doped films, following degradation, TSDC studies revealed only one peak with an activation 0.6–0.8 eV; this ionic space presumably due migration magnitude increased increasing times. A similar attributed existence also observed for Nb-doped films; decreased as PbO contents increased. An additional polaron hopping between Ti3+ Ti4+ found both annealed low pressure. Degraded samples exhibited chemical shift TiL2,3 lower losses appearance shoulders t2g eg peaks, implying reduction Ti cations regions near cathode.